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1

Experiment and design of a high-resolution optical encoder

Yi-Hua Fan, Ching-En Chen, Liao-Yong Lou, Chun-Yu Chen

Journal:

Microsystem Technologies

Année:

2013

Langue:

english

Fichier:

PDF, 702 KB

english, 2013

2

控擋片降級選擇之管理

Chen, Hsi-Chuan, Lee, Ching-En

Journal:

Journal of the Chinese Institute of Industrial Engineers

Année:

2000

Langue:

english

Fichier:

PDF, 2.38 MB

english, 2000

3

Impact of post-metal deposition annealing temperature on performance and reliability of high-K metal-gate n-FinFETs

Lin, Chien-Yu, Chang, Ting-Chang, Liu, Kuan-Ju, Tsai, Jyun-Yu, Chen, Ching-En, Liu, Hsi-Wen, Lu, Ying-Hsin, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung

Journal:

Thin Solid Films

Année:

2016

Langue:

english

Fichier:

PDF, 1.27 MB

english, 2016

4

在緊急訂單與延遲成本考量下零工型排程問題派工法之硏究

Lee, Ching-En, Chen, Chaw-Wen

Journal:

Journal of the Chinese Institute of Industrial Engineers

Année:

1999

Langue:

english

Fichier:

PDF, 1.51 MB

english, 1999

5

Increased prevalence and risk of anxiety disorders in adults with tinnitus: A population-based study in Taiwan

Lin, Ching-En, Chen, Li-Fen, Chou, Po-Han, Chung, Chi-Hsiang

Journal:

General Hospital Psychiatry

Année:

2017

Langue:

english

Fichier:

PDF, 701 KB

english, 2017

6

Compulsory admission is associated with an increased risk of readmission in patients with schizophrenia: a 7-year, population-based, retrospective cohort study

Lin, Ching-En, Chung, Chi-Hsiang, Chen, Li-Fen, Chen, Pei-Cih, Cheng, Hsin-Yi, Chien, Wu-Chien

Journal:

Social Psychiatry and Psychiatric Epidemiology

Année:

2018

Langue:

english

Fichier:

PDF, 922 KB

english, 2018

7

Charge trapping induced frequency-dependence degradation in n-MOSFETs with high-k/metal gate stacks

Chih-Hao Dai, Ting-Chang Chang, Ann-Kuo Chu, Yuan-Jui Kuo, Ya-Chi Hung, Wen-Hung Lo, Szu-Han Ho, Ching-En Chen, Jou-Miao Shih, Wan-Lin Chung, Hua-Mao Chen, Bai-Shan Dai, Tsung-Ming Tsai, Guangrui Xia,

Journal:

Thin Solid Films

Année:

2011

Langue:

english

Fichier:

PDF, 1.01 MB

english, 2011

8

A dispatching scheme involving move control and weighted due date for wafer foundries

Ching-En Lee, Chaw-Wen Chen

Journal:

IEEE Transactions on Components Packaging and Manufacturing Technology Part C

Année:

1997

Langue:

english

Fichier:

PDF, 225 KB

english, 1997

9

Improvement of near-ultraviolet InGaN-GaN light-emitting diodes through higher pressure grown underlying GaN layers

Ru-Chin Tu, Chun-Ju Tun, Shyi-Ming Pan, Hai-Ping Liu, Ching-En Tsai, Sheu, J.K., Chang-Cheng Chuo, Te-Chung Wang, Gou-Chung Chi, In-Gann Chen

Journal:

IEEE Photonics Technology Letters

Année:

2003

Langue:

english

Fichier:

PDF, 400 KB

english, 2003

10

Impact of strain on gate-induced floating body effect for partially depleted silicon-on-insulator p-type metal–oxide–semiconductor-field-effect-transistors

Lo, Wen-Hung, Chang, Ting-Chang, Dai, Chih-Hao, Chung, Wan-Lin, Chen, Ching-En, Ho, Szu-Han, Tsai, Jyun-Yu, Chen, Hua-Mao, Liu, Guan-Ru, Cheng, Osbert, Huang, Cheng-Tung

Journal:

Thin Solid Films

Année:

2013

Langue:

english

Fichier:

PDF, 1.77 MB

english, 2013

11

Abnormal temperature-dependent floating-body effect on Hot-Carrier Degradation in PDSOI n-MOSFETs

Liu, Kuan-Ju, Chang, Ting-Chang, Yang, Ren-Ya, Chen, Ching-En, Ho, Szu-Han, Tsai, Jyun-Yu, Hsieh, Tien-Yu, Cheng, Osbert, Huang, Cheng-Tung

Journal:

Thin Solid Films

Année:

2014

Langue:

english

Fichier:

PDF, 898 KB

english, 2014

12

Simplified Gate Driver Circuit for High-Resolution and Narrow-Bezel Thin-Film Transistor Liquid Crystal Display Applications

Lin, Chih-Lung, Chen, Fu-Hsing, Ciou, Wun-Cing, Du, Yuan-Wei, Wu, Chia-En, Lee, Ching-En

Journal:

IEEE Electron Device Letters

Année:

2015

Langue:

english

Fichier:

PDF, 719 KB

english, 2015

13

a-InGaZnO Active-Matrix Organic LED Pixel Periodically Detecting Thin-Film Transistor Threshold Voltage Once for Multiple Frames

Lin, Chih-Lung, Liu, Yen-Ting, Lee, Ching-En, Chen, Po-Syun, Chu, Ting-Ching, Hung, Chia-Che

Journal:

IEEE Electron Device Letters

Année:

2015

Langue:

english

Fichier:

PDF, 1.09 MB

english, 2015

14

Trap state passivation improved hot-carrier instability by zirconium-doping in hafnium oxide in a nanoscale n-metal-oxide semiconductor-field effect transistors with high-k/metal gate

Liu, Hsi-Wen, Chang, Ting-Chang, Tsai, Jyun-Yu, Chen, Ching-En, Liu, Kuan-Ju, Lu, Ying-Hsin, Lin, Chien-Yu, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han

Journal:

Applied Physics Letters

Année:

2016

Langue:

english

Fichier:

PDF, 1.27 MB

english, 2016

15

Fast-IV Measurement Investigation of the Role of TiN Gate Nitrogen Concentration on Bulk Traps in HfO 2 Layer in p-MOSFETs

Lu, Ying-Hsin, Chang, Ting-Chang, Liao, Jih-Chien, Chen, Li-Hui, Lin, Yu-Shan, Chen, Ching-En, Liu, Kuan-Ju, Liu, Xi-Wen, Lin, Chien-Yu, Lien, Chen-Hsin, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Chen

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2017

Langue:

english

Fichier:

PDF, 517 KB

english, 2017

16

[IEEE 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Burlingame, CA, USA (2017.10.16-2017.10.19)] 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - High-performance spiking neural net accelerators for embedded computer vision applications

Kim, Jung Kuk, Knag, Phil, Chen, Thomas, Liu, Chester, Lee, Ching-En, Zhang, Zhengya

Année:

2017

Langue:

english

Fichier:

PDF, 1.43 MB

english, 2017

17

DEVELOPMENT OF AN AUTOMATIC MEASUREMENT AND MATCHING MACHINE FOR COLUMNED BATTERY CELLS

Li, Xiaoxing, Fan, Yi-Hua, Chen, Ching-En, Tsao, Chia-Hui, Chen, Yu-Ming, Hsieh, Sheng-Chung

Journal:

Transactions of the Canadian Society for Mechanical Engineering

Année:

2016

Fichier:

PDF, 1.31 MB

2016

18

A modified technique for high-tension wound closure

Chen, Ching-En, Wang, Tien-Hsiang

Journal:

Journal of the American Academy of Dermatology

Année:

2019

Langue:

english

Fichier:

PDF, 314 KB

english, 2019

19

DESIGN OF A FUZZY-PID CONTROLLER FOR A NANOSCALE X-Y PLATFORM

Zheng, Xiuli, Fan, Yi-Hua, Chen, Ching-En, Lin, Ya-Qi, Liao, Hung-Wen, Hsieh, Sheng-Chung

Journal:

Transactions of the Canadian Society for Mechanical Engineering

Année:

2016

Fichier:

PDF, 2.93 MB

2016

20

Increased risk for venous thromboembolism among patients with concurrent depressive, bipolar, and schizophrenic disorders

Lin, Ching-En, Chung, Chi-Hsiang, Chen, Li-Fen, Chien, Wu-Chien

Journal:

General Hospital Psychiatry

Année:

2019

Langue:

english

Fichier:

PDF, 636 KB

english, 2019

21

Association between concurrent antidepressant and hypnotic treatment and the risk of dementia: A nationwide cohort study

Lin, Ching-En, Lee, Meei-Shyuan, Kao, Sen-Yeong, Chung, Chi-Hsiang, Chen, Li-Fen, Chou, Po-Han, Lee, Jia-Fu, Chien, Wu-Chien

Journal:

Journal of Affective Disorders

Année:

2020

Fichier:

PDF, 1.19 MB

2020

22

Repeated angioedema following administration of venlafaxine and mirtazapine

Ching-En Lin, Chih-Lun Chen

Journal:

General Hospital Psychiatry

Année:

2010

Langue:

english

Fichier:

PDF, 96 KB

english, 2010

23

Impact of Mechanical Strain on GIFBE in PD SOI p-MOSFETs as Indicated From NBTI Degradation

Wen-hung Lo, Ting-Chang Chang, Chih-Hao Dai, Wan-Lin Chung, Ching-En Chen, Szu-Han Ho, Cheng, O., Cheng Tung Huang

Journal:

IEEE Electron Device Letters

Année:

2012

Langue:

english

Fichier:

PDF, 410 KB

english, 2012

24

Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors

Dai, Chih-Hao, Chang, Ting-Chang, Chu, Ann-Kuo, Kuo, Yuan-Jui, Ho, Szu-Han, Hsieh, Tien-Yu, Lo, Wen-Hung, Chen, Ching-En, Shih, Jou-Miao, Chung, Wan-Lin, Dai, Bai-Shan, Chen, Hua-Mao, Xia, Guangrui, C

Journal:

Applied Physics Letters

Année:

2011

Langue:

english

Fichier:

PDF, 1.21 MB

english, 2011

25

Morphology Control of Nanofibril Donor–Acceptor Heterojunction To Achieve High Photoconductivity: Exploration of New Molecular Design Rule

Huang, Helin, Chou, Ching-En, Che, Yanke, Li, Ligui, Wang, Chen, Yang, Xiaomei, Peng, Zhonghua, Zang, Ling

Journal:

Journal of the American Chemical Society

Année:

2013

Langue:

english

Fichier:

PDF, 1.63 MB

english, 2013

26

Enhanced Bleeding Risk in an Elderly Dementia Patient Treated With Warfarin and Quetiapine

Chen, Tien-Yu, Lin, Ching-En, Chen, Li-Fen, Tzeng, Nian-Sheng

Journal:

Journal of Neuropsychiatry

Année:

2013

Langue:

english

Fichier:

PDF, 412 KB

english, 2013

27

Abnormal threshold voltage shift under hot carrier stress in Ti1−xNx/HfO2 p-channel metal-oxide-semiconductor field-effect transistors

Tsai, Jyun-Yu, Chang, Ting-Chang, Lo, Wen-Hung, Ho, Szu-Han, Chen, Ching-En, Chen, Hua-Mao, Tseng, Tseung-Yuen, Tai, Ya-Hsiang, Cheng, Osbert, Huang, Cheng-Tung

Journal:

Journal of Applied Physics

Année:

2013

Langue:

english

Fichier:

PDF, 1.43 MB

english, 2013

28

Abnormal interface state generation under positive bias stress in TiN/HfO2 p-channel metal-oxide-semiconductor field effect transistors

Lo, Wen-Hung, Chang, Ting-Chang, Tsai, Jyun-Yu, Dai, Chih-Hao, Chen, Ching-En, Ho, Szu-Han, Chen, Hua-Mao, Cheng, Osbert, Huang, Cheng-Tung

Journal:

Applied Physics Letters

Année:

2012

Langue:

english

Fichier:

PDF, 1.17 MB

english, 2012

29

Hole injection-reduced hot carrier degradation in n-channel metal-oxide-semiconductor field-effect-transistors with high-k gate dielectric

Tsai, Jyun-Yu, Chang, Ting-Chang, Lo, Wen-Hung, Chen, Ching-En, Ho, Szu-Han, Chen, Hua-Mao, Tai, Ya-Hsiang, Cheng, Osbert, Huang, Cheng-Tung

Journal:

Applied Physics Letters

Année:

2013

Langue:

english

Fichier:

PDF, 1.65 MB

english, 2013

30

Investigation of extra traps measured by charge pumping technique in high voltage zone in p-channel metal-oxide-semiconductor field-effect transistors with HfO2/metal gate stacks

Ho, Szu-Han, Chang, Ting-Chang, Wang, Bin-Wei, Lu, Ying-Shin, Lo, Wen-Hung, Chen, Ching-En, Tsai, Jyun-Yu, Chen, Hua-Mao, Liu, Guan-Ru, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Cao, Xi-Xi

Journal:

Applied Physics Letters

Année:

2013

Langue:

english

Fichier:

PDF, 1.48 MB

english, 2013

31

Abnormal sub-threshold swing degradation under dynamic hot carrier stress in HfO2/TiN n-channel metal-oxide-semiconductor field-effect-transistors

Tsai, Jyun-Yu, Chang, Ting-Chang, Lo, Wen-Hung, Chen, Ching-En, Ho, Szu-Han, Chen, Hua-Mao, Tai, Ya-Hsiang, Cheng, Osbert, Huang, Cheng-Tung

Journal:

Applied Physics Letters

Année:

2013

Langue:

english

Fichier:

PDF, 1.12 MB

english, 2013

32

Research on three dimensional machining effects using atomic force microscope

Mao, Yao-Ting, Kuo, Kai-Chen, Tseng, Ching-En, Huang, Jian-Yin, Lai, Yi-Chih, Yen, Jia-Yush, Lee, Chih-Kung, Chuang, Wei-Li

Journal:

Review of Scientific Instruments

Année:

2009

Langue:

english

Fichier:

PDF, 1.01 MB

english, 2009

33

Investigation of an anomalous hump in gate current after negative-bias temperature-instability in HfO2/metal gate p-channel metal-oxide-semiconductor field-effect transistors

Ho, Szu-Han, Chang, Ting-Chang, Wu, Chi-Wei, Lo, Wen-Hung, Chen, Ching-En, Tsai, Jyun-Yu, Liu, Guan-Ru, Chen, Hua-Mao, Lu, Ying-Shin, Wang, Bin-Wei, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tun

Journal:

Applied Physics Letters

Année:

2013

Langue:

english

Fichier:

PDF, 1.57 MB

english, 2013

34

High-k shallow traps observed by charge pumping with varying discharging times

Ho, Szu-Han, Chang, Ting-Chang, Lu, Ying-Hsin, Wang, Bin-Wei, Lo, Wen-Hung, Chen, Ching-En, Tsai, Jyun-Yu, Chen, Hua-Mao, Liu, Kuan-Ju, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Chen, Tsai

Journal:

Journal of Applied Physics

Année:

2013

Langue:

english

Fichier:

PDF, 3.85 MB

english, 2013

35

Investigation of abnormal negative threshold voltage shift under positive bias stress in input/output n-channel metal-oxide-semiconductor field-effect transistors with TiN/HfO2 structure using fast I-V measurement

Ho, Szu-Han, Chang, Ting-Chang, Lu, Ying-Hsin, Chen, Ching-En, Tsai, Jyun-Yu, Liu, Kuan-Ju, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Lu, Ching-Sen

Journal:

Applied Physics Letters

Année:

2014

Langue:

english

Fichier:

PDF, 2.13 MB

english, 2014

36

One Patient With Bipolar Depression and Medically Unexplained Pain Symptoms Despite Treatment

Lin, Ching-En, Chen, Li-Fen, Shih, Pei-Fei

Journal:

Journal of Neuropsychiatry

Année:

2014

Langue:

english

Fichier:

PDF, 415 KB

english, 2014

37

Hot Carrier Effect on Gate-Induced Drain Leakage Current in n-MOSFETs with HfO2∕Ti1-xNx Gate Stacks

Dai, Chih-Hao, Chang, Ting-Chang, Chu, Ann-Kuo, Kuo, Yuan-Jui, Ho, Szu-Han, Hsieh, Tien-Yu, Lo, Wen-Hung, Chen, Ching-En, Shih, Jou-Miao, Chung, Wan-Lin, Dai, Bai-Shan, Chen, Hua-Mao, Xia, Guangrui, C

Journal:

Electrochemical and Solid-State Letters

Année:

2012

Langue:

english

Fichier:

PDF, 223 KB

english, 2012

38

Analysis of an anomalous hump in gate current after dynamic negative bias stress in HfxZr1-xO2/metal gate p-channel metal-oxide-semiconductor field-effect transistors

Ho, Szu-Han, Chang, Ting-Chang, Wu, Chi-Wei, Lo, Wen-Hung, Chen, Ching-En, Tsai, Jyun-Yu, Luo, Hung-Ping, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Sze, Simon M.

Journal:

Applied Physics Letters

Année:

2012

Langue:

english

Fichier:

PDF, 1.10 MB

english, 2012

39

Analysis of anomalous traps measured by charge pumping technique in HfO2/metal gate n-channel metal-oxide-semiconductor field-effect transistors

Ho, Szu-Han, Chang, Ting-Chang, Lu, Ying-shin, Lo, Wen-Hung, Chen, Ching-En, Tsai, Jyun-Yu, Chen, Hua-Mao, Wu, Chi-Wei, Luo, Hung-Ping, Liu, Guan-Ru, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tu

Journal:

Applied Physics Letters

Année:

2012

Langue:

english

Fichier:

PDF, 1.17 MB

english, 2012

40

Electron-electron scattering-induced channel hot electron injection in nanoscale n-channel metal-oxide-semiconductor field-effect-transistors with high-k/metal gate stacks

Tsai, Jyun-Yu, Chang, Ting-Chang, Chen, Ching-En, Ho, Szu-Han, Liu, Kuan-Ju, Lu, Ying-Hsin, Liu, Xi-Wen, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Lu, Ching-Sen

Journal:

Applied Physics Letters

Année:

2014

Langue:

english

Fichier:

PDF, 1.28 MB

english, 2014

41

Hyponatremia Masquerading as Panic Symptoms in Bipolar Affective Disorder

Chen, Li-Fen, Chi, Hsin-Chang, Lin, Ching-En

Journal:

Journal of Neuropsychiatry

Année:

2014

Langue:

english

Fichier:

PDF, 411 KB

english, 2014

42

Wernicke’s Encephalopathy Mimicking an Acute Psychotic Disorder

Chen, Li-Fen, Lin, Ching-En

Journal:

Journal of Neuropsychiatry

Année:

2012

Langue:

english

Fichier:

PDF, 420 KB

english, 2012

43

Analysis of Oxide Trap Characteristics by Random Telegraph Signals in nMOSFETs with HfO2-Based Gate Dielectrics

Chen, Ching-En, Chang, Ting-Chang, You, Bo, Tsai, Jyun-Yu, Lo, Wen-Hung, Ho, Szu-Han, Liu, Kuan-Ju, Lu, Ying-Hsin, Liu, Xi-Wen, Hung, Yu-Ju, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Lu, C

Journal:

IEEE Electron Device Letters

Année:

2016

Fichier:

PDF, 868 KB

2016

44

[IEEE 2015 IEEE Workshop on Signal Processing Systems (SiPS) - Hangzhou, China (2015.10.14-2015.10.16)] 2015 IEEE Workshop on Signal Processing Systems (SiPS) - Reconfıgurable and selectively-adaptive signal processing for multi-mode wireless communication

Sheikh, Farhana, Andersson, Oskar, Lee, Ching-En, Xue, Feng, Chen, Chia-Hsiang, Vaidya, Anuja, Sharma, Ankit, Tetzlaff, Tom

Année:

2015

Fichier:

PDF, 1000 KB

2015

45

Analysis of Oxide Trap Characteristics by Random Telegraph Signals in nMOSFETs with HfO2-Based Gate Dielectrics

Chen, Ching-En, Chang, Ting-Chang, You, Bo, Tsai, Jyun-Yu, Lo, Wen-Hung, Ho, Szu-Han, Liu, Kuan-Ju, Lu, Ying-Hsin, Liu, Xi-Wen, Hung, Yu-Ju, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Lu, C

Journal:

IEEE Electron Device Letters

Année:

2016

Langue:

english

Fichier:

PDF, 868 KB

english, 2016

46

A BOTTLENECK-BASED GROUP SCHEDULING PROCEDURE FOR JOB-SHOP CELLS

Chen, Yu-Chang, Lee, Ching-En

Journal:

Journal of the Chinese Institute of Industrial Engineers

Année:

2001

Langue:

english

Fichier:

PDF, 249 KB

english, 2001

47

P-8: Investigating the Degradation Behaviors for Bottom/Top Gate Sweep under Negative Bias Illumination Stress in Dual Gate InGaZnO Thin Film Transistors

Tsai, Ming-Yen, Chang, Ting-Chang, Chu, Ann-Kuo, Hsieh, Tien-Yu, Chen, Ching-En, Chen, Hua-Mao, Liao, Po-Yung, Chen, Bo-Wei, Yang, Yu-Xin, Chen, Kuo-Kuang, Shih, Tsung-Hsiang, Lu, Hsueh-Hsing

Journal:

SID Symposium Digest of Technical Papers

Année:

2015

Langue:

english

Fichier:

PDF, 845 KB

english, 2015

48

51.3: A Mobility Enhancing Method Adopting A Multi-Active Layer Structure in Thin Film Transistors

Tsai, Ming-Yen, Chang, Ting-Chang, Chu, Ann-Kuo, Hsieh, Tien-Yu, Chen, Ching-En, Chen, Hua-Mao, Liao, Po-Yung, Chen, Bo-Wei, Yang, Yu-Xin, Chen, Kuo-Kuang, Shih, Tsung-Hsiang, Lu, Hsueh-Hsing, Huang,

Journal:

SID Symposium Digest of Technical Papers

Année:

2015

Langue:

english

Fichier:

PDF, 988 KB

english, 2015

49

Inverting the Topology of a Transmembrane Protein by Regulating the Translocation of the First Transmembrane Helix

Chen, Qiuyue, Denard, Bray, Lee, Ching-En, Han, Sungwon, Ye, James S., Ye, Jin

Journal:

Année:

2016

Langue:

english

Fichier:

PDF, 1.65 MB

english, 2016

50

Insertion of Simple Structure between Gate Driver Circuits to Prevent Stress Degradation in In-Cell Touch Panel Using Multi-V Blanking Method

Lin, Chih-Lung, Wu, Chia-En, Lee, Ching-En, Chen, Fu-Hsing, Chen, Po-Syun, Wang, Ming-Xun

Journal:

Journal of Display Technology

Année:

2016

Langue:

english

Fichier:

PDF, 526 KB

english, 2016